UV™ 210GS Positive DUV Photoresist

Dow Electronic Materials
UV™ 210GS Positive DUV Photoresist

Multipurpose resist that can be utilized for gate, phase shift mask contact holes, and trench applications in the 180-130 nm CD range

  • Compatible with a wide range of substrates including silicon and both organic and inorganic anti-reflective materials
  • 150°C thermal stability

UV™ 210GS Data Sheet



  • General Lithography: Positive DUV Resists

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